We are now offering a fabrication service in an effort to make the facility available to researchers who are either too far away from us or who would prefer to have us do the fab work for them. This service is available to members of the University of Houston, other universities, nonprofit organizations and industry.
If you are interested in this service please contact Technical Director, Dr. Long Chang, to discuss the scope and details of your project.
TEM Sample Preparation
TEM Sample Preparation is a technique in which the FIB is used to mill out a thin lamella which can be viewed in a transition electron microscope (TEM) to learn information about the cross-sectional depth profile of the bulk sample.
SEM micrograph of a the edge of a thin lamella milled with the UH Nanofab FIB.