Atomic Force Microscope
Name: Asylum Research MFP-3D ORIGIN+
Mfr.: Asylum Research
Type: Atomic Force Microscope
The AR MFP-3D ORIGIN+ is a versatile research instrument that records the interaction of an atomically sharp probe as it is scanned across a sample surface. The most basic mode is used to measure the topography of a sample. For more advanced operators, the instrument can be used to perform a variety of measurements such as magnetic force, piezo-electric force, adhesive force, etc.