Equipment—Analysis

Name: Asylum Research MFP-3D ORIGIN+
Mfr.: Asylum Research
Model: MFP-3D ORIGIN+
Type: Atomic Force Microscope
The AR MFP-3D ORIGIN+ is a versatile research instrument that records the interaction of an atomically sharp probe as it is scanned across a sample surface. The most basic mode is used to measure the topography of a sample. For more advanced operators, the instrument can be used to perform a variety of measurements such as magnetic force, piezo-electric force, adhesive force, etc.
Profilometer
Name: Alpha-Step 200 Profilometer
Mfr.: Tencor
Model: Alpha-Step 200
Type: Profilometer
The Alpha-Step 200 creates is used to view profiles of a sample surface. A sharp probe moves in a line along the surface, moving up or down when features on the surface are encountered. It is used to measure trench depth or step heights on a surface.
Name: Leitz Microscope
Mfr.: Leitz/Leika
Model: 20448026
Type: Inspection Microscope
Reflected light optical microscope with magnification up to 200x.
Name: Olympus Inspection Microscope
Mfr.: Olympus
Model: BHMJL
Type: Inspection Microscope
Optical microscope with magnification up to 800x.